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    University of Florida
  Dec 14, 2017
2017-2018 Graduate Catalog
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EEE 5408: Mixed Signal IC Testing I

Credits: 3                    Grading Scheme: Letter

Prerequisite: Analog and Digital Electronics. Students may not take this course if they have already taken EEE 4404.      

Fundamentals of Testing IC Devices and systems: test specifications, parametric testing, measurement accuracy, test hardware, sampling theory, digital signal processing based testing, and calibrations. Circuit analysis and design with analog and mixed-signal systems. Labs on testing passive components, LDOs, Op-amps, DACS/ADCs, Mixed-Signal ICs Labview and the National Instruments Savage Tester.

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